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121	Battery Drain Analysis Improves Mobile-Device Operating Time Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity. Edward Brorei Add to Reading List Source URL: literature.cdn.keysight.com Language: English - Date: 2008-06-26 13:38:28 Electronics Agilent Technologies Hewlett-Packard Agilent VEE Battery Power supply Rechargeable battery Field-effect transistor LAN eXtensions for Instrumentation Technology Electronic test equipment Computing
122	WLAN DesignGuide August 2005 Notice The information contained in this document is subject to change without notice. Agilent Technologies makes no warranty of any kind with regard to this material, Add to Reading List Source URL: cp.literature.agilent.com Language: English - Date: 2006-10-04 13:50:46 Electronics Information theory Multiplexing Orthogonal frequency-division multiplexing Software-defined radio Radio resource management IEEE 802.11a-1999 IEEE 802.11 Modulation Telecommunications engineering Data transmission Electronic engineering
123	Agilent Technologies Optical Amplifier Test Solutions • Fully automated, integrated turn-key solutions that provide flexibility, accuracy, and repeatability • Fast, accurate test methods Add to Reading List Source URL: literature.cdn.keysight.com Language: English - Date: 2005-04-12 13:10:08 Photonics Optical devices Fiber-optic communications Electronic test equipment Agilent Technologies Optical amplifier Optical fiber Erbium-doped waveguide amplifier Audio power Technology Amplifiers Optics
124	Microsoft Word[removed]5638EN_3[removed]docx Add to Reading List Source URL: literature.cdn.keysight.com Language: English - Date: 2010-03-31 09:10:30 Laboratory equipment Signal processing Code division multiple access Agilent Technologies Evolution-Data Optimized CDMA2000 Spectrum analyzer Vector signal analyzer Signal analyzer Technology Electronic test equipment Measuring instruments
125	Standardizing Functional Test Systems based on LXI Instrumentation Savings Potential and Benefits Klaus Diederich – General Manager System Integration Offering Add to Reading List Source URL: www.lxistandard.org Language: English - Date: 2012-09-05 16:30:33 LAN eXtensions for Instrumentation Computing Agilent Technologies Reliability engineering LabVIEW Automatic test equipment Electronic test equipment Technology Science
126	5988-4438EN 2_26_08cs2.indd Add to Reading List Source URL: literature.cdn.keysight.com Language: English - Date: 2009-09-22 19:10:03 Wireless networking IEEE 802 Electronic test equipment Laboratory equipment Metropolitan area networks WiMAX MIMO Agilent Technologies Orthogonal frequency-division multiplexing Technology Telecommunications engineering Electronic engineering
127	Park Systems Hosts 2013 Annual Boston User Group Meeting, Luncheon, and Roadshow on Behalf of Atomic Force Microscopy (AFM) Oct 21 and 22 Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, an Add to Reading List Source URL: www.prweb.com Language: English - Date: 2013-10-08 17:00:14 Scanning probe microscopy Intermolecular forces Park Systems Atomic force microscopy Microscopy Agilent Technologies Canton of Neuchâtel NanoWorld Science Scientific method Technology
128	Company : ABB China, Ltd. ABB Lummus Global Corp.-China Abbott Laboratories S.A. (Shanghai Representative Office) Agilent Technologies (Shanghai) Co., Ltd. AGREVO Tianjin Co., Ltd. Add to Reading List Source URL: pmmi.files.cms-plus.com Language: English - Date: 2011-03-29 16:44:58 Shenyang Shanghai Stock Exchange
129	Inficon HAPSITE Technology Advisory Sheet Add to Reading List Source URL: www.dtsc.ca.gov Language: English - Date: 2005-11-02 13:15:35 Chromatography Chemical pathology Measuring instruments Separation processes Mass spectrometry Headspace Agilent Technologies Gas chromatography California Department of Toxic Substances Control Chemistry Scientific method Science
130	Measurement Guide and Programming Examples PSA and ESA Series Spectrum Analyzers This manual provides documentation for the following instruments: Agilent Technologies PSA Series E4443A (3 Hz[removed]GHz) Add to Reading List Source URL: cp.literature.agilent.com Language: English - Date: 2004-05-20 18:24:27 Measurement Laboratory equipment Measuring instruments Radio electronics Audio electronics Spectrum analyzer Signal generator Agilent VEE Agilent Technologies Technology Electronic test equipment Electronics

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